期刊
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
卷 185, 期 5-7, 页码 159-166出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.elspec.2012.06.008
关键词
XPS; Ni oxides; Atomic ratios; Mixed phase oxides
类别
资金
- NSERC
The O/Ni ratios derived from the X-ray photoelectron (XP) spectra of a number of well-characterised Ni oxides were calculated and found to correspond well to the expected O/Ni ratios for these oxides. The measured ratios, combined with the characteristic XP spectra, provide a higher level of confidence to the assignment of O 1s chemical species, particularly for surfaces with multiple phases present. As examples of this, we discuss the additional information imparted by O/Ni ratios measured for oxides that were electrochemically grown on Ni and NiCr-20% alloy surfaces. (c) 2012 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据