期刊
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
卷 170, 期 1-3, 页码 25-36出版社
ELSEVIER
DOI: 10.1016/j.elspec.2008.01.002
关键词
Radiation damage; Soft X-rays; Photoemission electron microscopy; Scanning transmission X-ray microscopy; Polystyrene; Poly(methyl methacrylate); Fibrinogen; Polymer thin films
类别
资金
- NSF [DMR-9975694]
- DOE [DE-FG02-98ER45737]
- Dow Chemical
- Canadian Foundation for Innovation
- NSERC (Canada)
- Canada Research Chair Program
- Director, Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division of the U.S. Department of Energy [DE-AC03-76SF00098]
The rates of chemical transformation by radiation damage of polystyrene (PS), poly(methyl methacrylate) (PMMA), and fibrinogen (Fg) in a X-ray photoemission electron microscope (X-PEEM) and in a scanning transmission X-ray microscope (STXM) have been measured quantitatively using synchrotron radiation. As part of the method of dose evaluation in X-PEEM, the characteristic (1/e) sampling depth of X-PEEM for polystyrene in the C 1s region was measured to be 4 1 nm. Critical doses for chemical change as monitored by changes in the X-ray absorption spectra are 80 (12),280 (40) and 1230 (180) MGy (1 MGy = 6.242* rho eV/nm(3), where rho is the polymer density in g/cm(3)) at 300 eV photon energy for PMMA, Fg and PS, respectively. The critical dose for each material is comparable in X-PEEM and STXM and the values cited are thus the mean of the values determined by X-PEEM and STXM. C 1s, N 1s and O 1s spectroscopy of the damaged materials is used to gain insight into the chemical changes that soft X-rays induce in these materials. (C) 2008 Elsevier B.V. All rights reserved.
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