期刊
JOURNAL OF ELECTRON MICROSCOPY
卷 59, 期 2, 页码 103-112出版社
OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfp052
关键词
STEM; low-dose; aberration correction
类别
资金
- University of Tokyo [JEM-2100F/Cs]
During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM.
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