4.4 Article

Fabrication of semiconducting SrB6-δ thin films on ultrasmooth sapphire substrates by laser molecular beam epitaxy

期刊

JOURNAL OF CRYSTAL GROWTH
卷 312, 期 3, 页码 378-381

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2009.11.015

关键词

Crystal structure; Growth models; Reflection high energy electron diffraction; Laser epitaxy; Inorganic compounds; Semiconducting materials

资金

  1. Ministry of Education, Culture, Sports, Science, and Technology of Japan
  2. National Institute of Advanced Industrial Science and Technology of Japan
  3. New Energy and Industrial Technology Development Organization of Japan
  4. Ministry of Economy, Trade, and Industry of Japan

向作者/读者索取更多资源

We fabricated epitaxial SrB6 (1 0 0) thin films on ultrasmooth sapphire (alpha-Al2O3 single crystal) (0 0 0 1) substrates by laser molecular beam epitaxy. Reflection high-energy electron diffraction and X-ray diffraction measurements indicated the heteroepitaxial structure of SrB6 (1 0 0)/sapphire (0 0 0 1) with three domains of epitaxial relationship. The prepared films exhibited atomically stepwise surface morphology, similar to that of the ultrasmooth substrate used, with 0.2-nm-high atomic steps and similar to 70-nm-wide terraces. The SrB6 epitaxial thin films showed semiconducting behavior, with a resistivity of 4.8 Omega cm at room temperature. (C) 2009 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据