4.6 Article

Effects of surface roughness on surface charge accumulation characteristics and surface flashover performance of alumina-filled epoxy resin spacers

期刊

JOURNAL OF APPLIED PHYSICS
卷 124, 期 8, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.5043239

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资金

  1. National Natural Science Foundation of China [51577150]
  2. National Basic Research Program of China (973 Program) [2015CB251003]
  3. Science and Technology Project of State Grid Sichuan Electric Power Company [521904160001]

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The accumulated charges on the insulator surface become a key factor to incur surface flashover. The charge accumulation process is closely related to the surface condition. This research investigates the effects of surface roughness on surface charge accumulation behavior and surface flashover performance of alumina-filled epoxy resin spacers in SF6/N-2 mixtures under DC voltage. The insulator is prepared with only half surface subjected to rough treatment. The accumulated charges are distributed in two regions. Considerable homo-charges are located near the high voltage (HV) electrode and few hetero-charges are near the grounded (GND) electrode (region I). These charges are injected by electrodes. The bipolar charges between HV and GND electrodes (region II) originate from gas ionization. Surface rough treatment can suppress surface charge accumulation and improve surface insulation strength. When increasing surface roughness, surface charge declines first slowly (stage I) and then rapidly (stage II), which coincides with the two stages of surface flashover voltage increment. Surface charge declination at stage I is mainly due to the increase in surface conductivity, while at stage II, the introduced deep traps also play a role. Surface flashover voltage increment at stage I is mainly due to the extended creepage distance, while at stage II, the declination of surface charge also plays a role. Besides, the block of electron avalanche development by the roughed surface is also responsible for the increase in surface flashover voltage at these two stages. Published by AIP Publishing.

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