期刊
JOURNAL OF APPLIED PHYSICS
卷 114, 期 8, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4819384
关键词
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资金
- DFG [SFB 762]
- Alexander von Humboldt Foundation
Epitaxial PbSc0.5Ta0.5O3 (001) films with an epitaxial LaNiO3 bottom electrode were deposited on CeO2/yttria-stabilized zirconia-buffered Si (100) substrates. Crystal orientation, in-plane and out-of-plane lattice parameters, surface morphology, and microstructure were analyzed by X-ray diffraction, X-ray reciprocal lattice mapping measurements, atomic force microscopy, and transmission electron microscopy, respectively. XRD superstructure reflections indicate that the films are cation ordered. Polarization-field and switching current-voltage hysteresis curves were measured at room temperature. The measured spontaneous polarization P-s, remnant polarization P-r, and coercive voltage V-c were found to be 14 mu C/cm(2), 4 mu C/cm(2), and 1.1V, respectively, at room temperature. Furthermore, field as well as frequency dependence of the dielectric constant were measured at room temperature. Piezoelectric measurements performed on these PST films showed a sharp non-linearity, which is attributed to the possibility of field induced phase transition and/or percolation of polar nano regions. (C) 2013 AIP Publishing LLC.
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