期刊
JOURNAL OF APPLIED PHYSICS
卷 113, 期 6, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4790875
关键词
-
资金
- Regione Autonoma della Sardegna (POR Sardegna)
- Dutch Stichting Technische Wetenschappen VIDI
- Delft University of Technology
Thin oxide interlayers are commonly added to the back reflector of thin-film silicon solar cells to increase their current. To gain more insight in the enhancement mechanism, we tested different back reflector designs consisting of aluminium-doped zinc oxide (ZnO:Al) and/or hydrogenated silicon oxide (SiOx:H) interlayers with different metals (silver, aluminium, and chromium) in standard p-i-n a-Si:H solar cells. We use a unique inverse modeling approach to show that in most back reflectors the internal metal reflectance is lower than expected theoretically. However, the metal reflectance is increased by the addition of an oxide interlayer. Our experiments demonstrate that SiOx:H forms an interesting alternative interlayer because unlike the more commonly used ZnO:Al it can be deposited by plasma-enhanced chemical vapour deposition and it does not reduce the fill factor. The largest efficiency enhancement is obtained with a double interlayer of SiOx:H and ZnO:Al. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4790875]
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据