期刊
JOURNAL OF APPLIED PHYSICS
卷 112, 期 5, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4746085
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资金
- U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division through the Office of Science Early Career Research Program
- Center for Nanophase Materials Sciences
- Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy
- U.S. Department of Energy [DE-AC05-00OR22725]
Three-dimensional vector imaging of bias-induced displacements of surfaces of ionically conductive materials using electrochemical strain microscopy (ESM) is demonstrated for model polycrystalline LiCoO2 surface. We demonstrate that resonance enhanced imaging using band excitation detection can be performed both for out-of-plane and in-plane response components at flexural and torsional resonances of the cantilever, respectively. The image formation mechanism in vector ESM is analyzed and relationship between measured signal and grain orientation is discussed. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4746085]
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