p-Type-doped ZnO films were grown on nominally undoped n-ZnO, which is deposited on p-Si:B by electrochemical deposition. The electrical properties of individually doped ZnO:Na/Mg/Sb/Ti films were determined by means of the Hall system at the room temperature. Our results showed that doped ZnO films had high mobility ranging from 11 to 638 cm(2)/V s, carrier concentration ranging from 6.00 x 10(16) to 3.37 x 10(19) cm(-3), and low resistivity ranging from 1.62 x 10(-2) to 21.9 x 10(-2) Omega cm. Electroluminescence measurements of obtained homojunctions exhibited three main broad luminescence bands peaking at 2.8, 2.5, and 1.98 eV, respectively. In addition to these broadbands, Fabry-Perot oscillations were also observed. (C) 2011 American Institute of Physics. [doi:10.1063/1.3627247]
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据