4.6 Article

Ellipsometry of graphene on a substrate

期刊

JOURNAL OF APPLIED PHYSICS
卷 107, 期 3, 页码 -

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AIP Publishing
DOI: 10.1063/1.3295913

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elemental semiconductors; graphene; Maxwell equations; monolayers; narrow band gap semiconductors; optical conductivity; reflectivity; semiconductor thin films; tensors

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Monolayer graphene deposited on a dielectric substrate material is investigated theoretically using Maxwell's equations to study its optical properties. Optical quantities such as reflected polarization and reflection coefficient are important since they are able to provide information about the conductivity tensor of the graphene layer. This study can be considered as a general one which gives the suspended graphene as its limiting case. The focus of this study is the effect of substrate on graphene (suspended) optical properties for which a comparison between the suspended graphene and graphene on substrate is made here at each stage. An investigation of the reflection coefficient reveals the presence of Brewster's-like phenomena which is not observable in suspended graphene.

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