期刊
JOURNAL OF APPLIED PHYSICS
卷 107, 期 10, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3406136
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资金
- National University of Singapore
- Engineering and Physical Science Research Council [EP/F006098/1]
- Engineering and Physical Sciences Research Council [EP/G005001/1] Funding Source: researchfish
- EPSRC [EP/G005001/1] Funding Source: UKRI
Polycrystalline Ba(Ti0.85Sn0.15)O-3/Bi1.5Zn1.0Nb1.5O7 (BTS/BZN) heterostructure thin films were deposited on LaNiO3/SiO2/Si substrates by pulsed laser deposition. The leakage mechanisms of the BTS/BZN heterostructure thin films were studied in the temperature range from 303 to 403 K. At a high electric field (> 100 kV/cm) and a positive bias, the leakage is dominated by space-charge-limited-current, while Fowler-Nordheim tunneling is the main reason for conduction under a negative bias. At a low electric field, the leakage current is controlled by the Ohmic contact. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3406136]
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