期刊
JOURNAL OF APPLIED PHYSICS
卷 106, 期 4, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3203937
关键词
-
资金
- European Project [019948]
- Swiss Federal Office of Energy [101191]
We present a study of the optical mode structure in metal-dielectric multilayer structures that represent amorphous silicon thin film solar cells with metallic back contact. Knowledge of the modal structure represents a first step toward describing absorption enhancement by the interface texture in solar cells. We present a method for determining experimentally the dispersion relations of multilayer films by coupling polarized light in a spectral reflection measurement to eigenmodes, using a one-dimensional sinusoidal grating. Because the used grating represents only a minor perturbation that establishes the coupling, the experimental data is well explained by the modal structure of a geometry with flat interfaces. On the basis of the measured mode structure, we propose an explanation for the beneficial effect of a low index buffer layer between the silicon absorber and the metallic back reflector. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3203937]
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