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注意：仅列出部分参考文献，下载原文获取全部文献信息。Current topics of silicon germanium devices
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Characterization of Ge gradients in SiGeHBTs by AES depth profile simulation
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Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1-xGex alloy layers
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Memory effect and redistribution of Mg into sequentially regrown GaN layer by metalorganic chemical vapor deposition
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Low energy plasma enhanced chemical vapor deposition
M Kummer et al.
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SiGe - heterostructures for CMOS technology
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