期刊
JOURNAL OF APPLIED PHYSICS
卷 106, 期 2, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3182726
关键词
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资金
- Donostia Internacional Physics Center (DIPC)
- Basque Country Government [IT-436-07]
- Spanish Ministry of Science and Innovation [MAT 2007-63681]
- European Community
We present a method to determine the local dielectric permittivity of thin insulating layers. The measurement is based on the detection of force gradients in electric force microscopy by means of a double pass method. The proposed experimental protocol is simple to implement and does not need any modification of standard commercial devices. Numerical simulations based on the equivalent charge method make it possible to carry out quantification whatever the thickness of film, the radius of the tip, and the tip-sample distance. This method has been validated on a thin SiO2 sample for which the dielectric permittivity at the nanoscale has been characterized in the literature. We also show how we can quantitatively measure the local dielectric permittivity for ultrathin polymer film of poly(vinyl acetate) and polystyrene. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3182726]
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