期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 45, 期 -, 页码 862-868出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889812027173
关键词
QPCED2; 0; polycrystalline diffraction; selected-area electron diffraction; pattern processing; pattern quantification; computer programs
The processing and quantification of electron diffraction patterns have become vital in advanced electron crystallographic analysis work. A computer program, QPCED2.0, has been developed for the handling of selected-area electron diffraction patterns for polycrystalline materials. QPCED2.0 can be used to enhance the visibility of electron diffraction patterns, to convert electron diffraction patterns into intensity profiles, and to retrieve precisely the lattice d spacings and the integral intensities of the diffraction rings. The design and implementation of QPCED2.0 are elucidated and application examples are given.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据