期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 45, 期 -, 页码 22-27出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889811055075
关键词
anisotropic line broadening; ellipsoidal formula; crystallite size; crystallite shape; X-ray powder diffraction
资金
- Danish Agency for Science, Technology and Innovation
- Carlsberg Foundation
Anisotropic broadening correction in X-ray powder diffraction by an ellipsoidal formula is applied on samples with nanosized crystals. Two cases of minerals with largely anisotropic crystallite shapes are presented. The properly applied formalism not only improves the fitting of the theoretical and observed diffraction diagrams but also gives direct information about realistic crystallite shapes and sizes. The approach is demonstrated using the Rietveld refinement program TOPAS and it is easily adaptable to other similar software.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据