相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
M. Bartosik et al.
ADVANCED ENGINEERING MATERIALS (2011)
In situ observation of cluster formation during nanoparticle solution casting on a colloidal film
S. V. Roth et al.
JOURNAL OF PHYSICS-CONDENSED MATTER (2011)
Holographic and diffractive x-ray imaging using waveguides as quasi-point sources
K. Giewekemeyer et al.
NEW JOURNAL OF PHYSICS (2010)
Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
Alexander M. Korsunsky et al.
SURFACE & COATINGS TECHNOLOGY (2010)
Residual stress depth profiling in complex hard coating systems by X-ray diffraction
M. Klaus et al.
THIN SOLID FILMS (2008)
In situ observation of nanoparticle ordering at the air-water-substrate boundary in colloidal solutions using x-ray nanobeams
S. V. Roth et al.
APPLIED PHYSICS LETTERS (2007)
A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale
S. Massl et al.
ACTA MATERIALIA (2007)
X-ray waveguide nanostructures: Design, fabrication, and characterization
A. Jarre et al.
JOURNAL OF APPLIED PHYSICS (2007)
Microstructural design of hard coatings
Paul H. Mayrhofer et al.
PROGRESS IN MATERIALS SCIENCE (2006)
Refractive x-ray lenses
B Lengeler et al.
JOURNAL OF PHYSICS D-APPLIED PHYSICS (2005)
Two-dimensional hard X-ray beam compression by combined focusing and waveguide optics
A Jarre et al.
PHYSICAL REVIEW LETTERS (2005)
Focusing X-ray beams to nanometer dimensions
C Bergemann et al.
PHYSICAL REVIEW LETTERS (2003)
Two-dimensional x-ray waveguides and point sources
F Pfeiffer et al.
SCIENCE (2002)
Microcrystallography with an X-ray waveguide
M Müller et al.
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2000)
分享论文
