期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 44, 期 -, 页码 241-246出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889810048739
关键词
X-ray diffraction modelling; area detectors; texture analysis; fibre texture; ANAELU
A new software package for interpreting two-dimensional diffraction diagrams is presented. The application capabilities include representation of single- and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two-dimensional diffraction patterns obtained from both single-crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two-dimensional diffraction patterns. An example showing the capabilities of the software is presented.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据