期刊
JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷 42, 期 -, 页码 1030-1034出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889809040126
关键词
-
资金
- National Science Foundation
- National Institutes of Health/National Institute of General Medical Sciences [DMR-0225180]
Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite size effects in X-ray scattering. Various aspects of Scherrer-type grain-size analysis are discussed with regard to the characterization of thin films with grazing-incidence scattering methods utilizing area detectors. After a brief review of the basic features of Scherrer analysis, a description of resolution-limiting factors in grazing-incidence scattering geometry is provided. As an application, the CHESS D1 beamline is characterized for typical scattering modes covering length scales from the molecular scale to the nanoscale.
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