期刊
JOURNAL OF ANALYTICAL CHEMISTRY
卷 65, 期 13, 页码 1370-1376出版社
MAIK NAUKA/INTERPERIODICA/SPRINGER
DOI: 10.1134/S1061934810130101
关键词
depth potiling; ion sputtering; glow discharge optical emission spectrometry (GD-OES); nitride multilayer coatings; round-robin characterization; secondary ion mass spectrometry (SIMS)
Round-robin characterization is reported on the sputter depth profiling of CrN/AlN multilayer thin-film coatings on nickel alloy by secondary ion mass spectrometry (SIMS) and glow-discharge optical emission spectrometry (GD-OES). It is demonstrated that a CAMECA SIMS 4550 Depth Profiler operated with 3 keV O (2) (+) primary ions provides the best depth resolution and sensitivity. The key factor is sample rotation, which suppresses the negative influence of the surface topography (initial and ion-induced) on the depth profile characteristics.
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