期刊
JOURNAL OF ALLOYS AND COMPOUNDS
卷 586, 期 -, 页码 674-678出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2013.10.107
关键词
NBT-xST; Energy storage; Thick films
资金
- National Natural Science Foundation of China [51002071]
- Program for New Century Excellent Talents in University
- Program for Young Talents of Science and Technology in Universities of Inner Mongolia Autonomous Region
In this work, (1 - x)(Na0.5Bi0.5) TiO3-xSrTiO(3) (abbreviated as NBT-xST, x = 0%, 20%, 26%, 30%, 36%) thick films with 3 wt% 3Bi(2)O(3)-2Li(2)O glass addition were successfully fabricated via a screen printing method. The dielectric properties and energy-storage performances were studied systematically. It was found that the dielectric constant of NBT-xST films decreased with ST content increasing and that the films exhibited relaxor behavior. The highest recoverable energy density of 2.7 J/cm(3) under 600 kV/cm was achieved in the sample with 30 mol% ST content, which also displayed good energy-storage stability in the temperature range from room temperature to 200 degrees C. Simultaneously, the leakage current was greatly reduced due to the addition of ST. (C) 2013 Elsevier B.V. All rights reserved.
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