期刊
JOURNAL OF ALLOYS AND COMPOUNDS
卷 580, 期 -, 页码 538-543出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2013.05.014
关键词
Nitrogen; Aluminum; Photoluminescence; Hall mobility; p-type conductivity; Photocurrent measurement
资金
- National Research Foundation of Korea [2011-0015829]
- National Research Foundation of Korea [2011-0015829] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
Al, N co-doped zinc oxide thin films were prepared using sol-gel assisted spin coating method with a range of nitrogen (N) doping (x = 0, 1, 2). The deposited films were characterized through X-ray diffraction, UV-visible spectroscopy, photoluminescence spectroscopy and hall measurements to find structural, optical and electrical properties. The X-ray diffraction pattern was confirmed the existence of polycrystalline nature with wurtzite structure. The strong band emission and green emission peaks have been observed in Al, N co-doped films. The nitrogen undoped film demonstrated n-type conductivity and nitrogen doping brings p-type conductivity with maximum hole concentration of 8.111 x 10(16) cm(-3), carrier mobility of 9.965 cm(2)/V.s for higher nitrogen doped film (x = 2). The UV photo responsivity (7.17 x 10(-5) A/W) and gain (724.36 x 10(-5)) of photo detector has been improved by a one order of magnitude in low nitrogen doping and decay time has been reduced drastically from 58.27 s to 10.32 s. These results demonstrated that the improved responsivity and decay time by 1 at% of nitrogen doping. (c) 2013 Elsevier B.V. All rights reserved.
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