期刊
JOURNAL OF ALLOYS AND COMPOUNDS
卷 562, 期 -, 页码 1-4出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2013.02.035
关键词
Ceramics; X-ray diffraction; Dielectric properties; Secondary phase
资金
- Natural Science Foundation of Shenzhen University
- Shenzhen Key Laboratory of New Lithium-Ion Battery and Mesoporous Materials
Two CaCu3Ti4O12 (CCTO) ceramics are separately sintered for 10 h at 975 and 1000 degrees C. The correlation between the microstructures and dielectric properties of the ceramics has been explored in this paper. The CuO secondary phase is separated out and locates at grain boundaries of the surface layer when the sintering temperature is raised up to 1000 degrees C. The presence of the CuO phase highly reduces the grain-boundary thickness and helps the grain growth, which together result in the increase of the dielectric constant. The low-frequency dielectric loss decreases due to the density improvement of the CCTO ceramics, and the high-frequency dielectric loss increases due to the reduction of the grain-boundary volume. The dielectric loss as low as 0.074 is obtained from the ceramic pellet sintered at 1000 degrees C. (C) 2013 Elsevier B.V. All rights reserved.
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