期刊
JOURNAL OF ALLOYS AND COMPOUNDS
卷 536, 期 -, 页码 S532-S537出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2012.01.102
关键词
Graphene oxide; Reduction; Temperature-programmed desorption; Scanning tunneling microscopy; Atomic force microscopy
资金
- Spanish MICINN [MAT2008-05700, MAT2011-26399]
- MICINN
- CSIC
Chemical reduction of exfoliated graphite oxide (graphene oxide) has become one of the most promising routes for the mass production of graphene sheets. Nonetheless, the material obtained by this method exhibits considerable structural disorder and residual oxygen groups, and reports on their microscopic structure are quite scarce. We have investigated the structure and chemistry of graphene oxide samples reduced to different degrees using atomic force and scanning tunneling microscopy (AFM/STM) as well as X-ray photoelectron spectroscopy (XPS) and temperature-programmed desorption (TPD), respectively. TPD and XPS results indicate that reduction proceeds mainly by eliminating the most labile oxygen groups, which are ascribed to epoxides and hydroxyls on basal positions of the graphene plane. AFM/STM shows that the sheets are composed of buckled oxidized regions intermingled with flatter, non-oxidized ones, with the relative area of the latter increasing with the reduction degree. (c) 2012 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据