Grain and crystallite size evaluation of cryomilled pure copper

The crystallite and grain sizes of pure copper milled at cryogenic temperature for different periods have been characterized using X-ray diffraction (XRD) and transmission electron microscopy (TEM). X-ray line profile analysis using a modified Williamson-Hall method [T. Ungar, A. Revesz, A. Borbely, J. Appl. Crystallogr. 31 (1998) 554], which takes into account the strain anisotropy induced by dislocations and planar faults, was used to determine the size of the coherently scattering domains. The results reveal that the modified Williamson-Hall method leads to values that are in very good agreement with the data obtained by TEM, in particular when considering the effect of planar faults. (C) 2011 Elsevier B.V. All rights reserved.