期刊
JOURNAL OF ALLOYS AND COMPOUNDS
卷 487, 期 1-2, 页码 786-789出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2009.08.069
关键词
Thin films; Optical properties; X-ray diffraction
资金
- UGC, New Delhi
Molybdenum disulphide thin films were deposited using chemical bath deposition method on non-conducting glass substrate using tartaric acid as a complexing agent at 363 K. The films were characterized by X-ray diffraction, scanning electron microscopy, optical absorption and electrical measurements. X-ray diffraction pattern shows that polycrystalline with hexagonal structure. The direct optical band gap was found to be 1.8 eV. Electrical measurement suggests that specific conductance was found in the order of 10(-5) to 10(-2) (Omega cm)(-1) and showing n-type conduction mechanism. (C) 2009 Elsevier B.V. All rights reserved.
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