期刊
JOURNAL OF ALLOYS AND COMPOUNDS
卷 468, 期 1-2, 页码 179-186出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2008.01.027
关键词
Intermetallics; Scanning and transmission electron microscopy; Crystal structural and symmetry
资金
- NSFC [50271073]
High-resolution electron microscopy (HREM) images of the overlap structures in TiAl have been studied by the comparisons of experimental techniques and theoretic simulations. Several misunderstandings about TiAl microstructures were corrected. First, studies revealed that the reported 9R structures in TiAl must result from the overlap of two twin-relaled gamma laths. They were not the true 9R structure. Second, the fringes (FR) between the gamma and alpha(2) phases have once been misconsidered as the stacking faults fringes which promoted the alpha(2) <-> gamma phase transformation, This work proved them lobe the fringes caused by the overlap of the alpha(2) and gamma phases. Through study of the imaging of the overlap structures, a new formation mechanism of the fringes has been proposed. (C) 2008 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据