4.8 Article

Direct Growth of Single- and Few-Layer MoS2 on h-BN with Preferred Relative Rotation Angles

期刊

NANO LETTERS
卷 15, 期 10, 页码 6324-6331

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.5b01311

关键词

Molybdenum disulfide; chemical vapor deposition; heterostructure; hexagonal boron nitride; screw-dislocation driven growth; transition metal dichalcogenides

资金

  1. Office of Basic Energy Sciences, Materials Sciences and Engineering Division of the U.S. Department of Energy [DE-AC02-05CH11231]
  2. NSF [DMR-1206512]
  3. Molecular Foundry of the Lawrence Berkeley National Laboratory [DE-AC02-05CH11231]
  4. Direct For Mathematical & Physical Scien [1206512] Funding Source: National Science Foundation
  5. Division Of Materials Research [1206512] Funding Source: National Science Foundation

向作者/读者索取更多资源

Monolayer molybdenum disulfide (MoS2) is a promising two-dimensional direct-bandgap semiconductor with potential applications in atomically thin and flexible electronics. An attractive insulating substrate or mate for MoS2 (and related materials such as graphene) is hexagonal boron nitride (h-BN). Stacked heterostructures of MoS2 and h-BN have been produced by manual transfer methods, but a more efficient and scalable assembly method is needed. Here we demonstrate the direct growth of single- and few-layer MoS2 on h-BN by chemical vapor deposition (CVD) method, which is scalable with suitably structured substrates. The growth mechanisms for single-layer and few-layer samples are found to be distinct, and for single-layer samples low relative rotation angles (<5 degrees) between the MoS2 and h-BN lattices prevail. Moreover, MoS2 directly grown on h-BN maintains its intrinsic 1.89 eV bandgap. Our CVD synthesis method presents an important advancement toward controllable and scalable MoS2-based electronic devices.

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