Solution-TiO2 Interface Probed by Frequency-Modulation Atomic Force Microscopy

The topography and solvation structure of a solution-TiO2 interface were observed in the dark using highly sensitive, frequency-modulated atomic force microscopy (FM-AFM). The nucleation and growth of an ionic solute, KCI, in this study, were observed in constant frequency-shift topography. The force applied to the tip was determined as a function of tip-surface distance. Modulations were identified on some force curves and were found to be related to the site-specific density of water molecules. (C) 2009 The Japan Society of Applied Physics