期刊
JAPANESE JOURNAL OF APPLIED PHYSICS
卷 48, 期 9, 页码 -出版社
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.48.09KA12
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(Ba0.6Sr0.4)TiO3 (BST) films with 300-1700 nm thicknesses were deposited on SrTiO3 (STO), 0.5wt% Nb-doped STO and (La0.5Sr0.5)CoO3-coated STO substrates by pulsed laser deposition. X-ray diffraction analysis results indicate that the deposited BST thick films were epitaxially grown on the substrates and c-lattice parameter of BST was increased compared with that of the bulk material owing to stress in the film. The fabricated film capacitors showed a hysteresis curve in the capacitance-voltage curve at room temperature. Hysteresis width linearly increased with increasing BST c-lattice parameter. (C) 2009 The Japan Society of Applied Physics
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