期刊
JAPANESE JOURNAL OF APPLIED PHYSICS
卷 47, 期 4, 页码 2349-2353出版社
IOP PUBLISHING LTD
DOI: 10.1143/JJAP.47.2349
关键词
germanium; germanium oxide; MIS capacitor; interface; C-V characteristics; TDS; volatilization; cap layer; Ni-silicide
From the studies on the thermal desorption behaviors of GeO2 film and its impact on the electrical properties of GeO2/Ge metal-insulator-semiconductor (MIS) capacitors, it was clarified that the GeO volatilization is driven by the interface reaction at GeO2/Ge, and that volatilization is the origin of the interface deterioration of the MIS capacitors. We found that a Si cap layer formed on top of the GeO2 film suppresses the GeO desorption very efficiently. Then, a marked improvement of the capacitance-voltage (C-V) characteristics was successfully demonstrated with the GeO2/Ge MIS capacitors fabricated by capped annealing process, where a Ni silicide electrode was used as the cap layer. These results provided us quite an important guide for realizing high-quality Ge/dielectric interfaces.
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