4.3 Article

Smooth and Narrow Nanopillars Fabricated by Ion-Beam-Induced Deposition under Charging Conditions

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JAPANESE JOURNAL OF APPLIED PHYSICS
卷 47, 期 10, 页码 8120-8123

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JAPAN SOCIETY APPLIED PHYSICS
DOI: 10.1143/JJAP.47.8120

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ion-beam-induced deposition; charging effect; secondary electrons; gas molecule aggregation

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  1. NanoNed

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We investigate the formation of the irregular sidewall and halo of pillars grown by ion-beam-induced deposition (IBID) by,growing platinum nanopillars on an insulating Si(3)N(4) membrane and on a semiconducting Si wafer with a thin Si3N4 top layer. As compared with the pillars grown in a conductive environment, the pillars grown on an insulating membrane are smoother, higher and thinner but have the same volume. Furthermore. they arc accompanied by smaller halos. These differences Suggest a distinct charging effect in IBID pillar growth. This charging effect is attributed to the secondary electron emission and possibly the aggregation of precursor gas molecules. [DOI: 10.1143/JJAP.47.8120]

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