期刊
INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS
卷 47, 期 -, 页码 38-43出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.ijrmhm.2014.05.012
关键词
Cemented carbide; Plastic deformation; Sigma 2 grain boundary; Grain boundary plane distribution; Electron backscattered diffraction; Five parameter analysis
资金
- Office of Naval Research [N00014-11-1-0678]
- Carnegie Mellon MRSEC, under National Science Foundation [DMR-0520425]
- National Natural Science Foundation of China [51174009]
- Beijing Natural Science Foundation [2123061]
- State Key Lab of Advanced Metals and Materials [2013-Z01]
Grain boundary plane distributions have been measured for Sigma 2 grain boundaries (boundaries that have a 90 degree rotation about the [10-10] axis) in undeformed and plastically deformed WC-Co cemented carbides. By virtue of electron backscattered diffraction data coupled with the five parameter analysis method, the measurements show that while the misorientations of the Sigma 2 boundaries are 20% reduced by the plastic deformation, there are 33% reduction in the orientation of the Sigma 2 twist grain boundary plane. A dislocation model for grain boundary plane reorientation during plastic deformation is proposed. (C) 2014 Elsevier Ltd. All rights reserved.
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