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Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy

期刊

INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES
卷 13, 期 10, 页码 12773-12856

出版社

MDPI
DOI: 10.3390/ijms131012773

关键词

van der Waals; adhesion; surface forces; atomic force microscopy; atomic force spectroscopy; structural forces; double-layer; wettability; AFM

资金

  1. FAPESP [2007/05089-9]
  2. CNPq [483303/2011-9]
  3. CAPES [02880/09-1]
  4. nBioNet
  5. University of Sao Paulo
  6. Federal University of Sao Carlos

向作者/读者索取更多资源

The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials science, for these are the prevailing forces in micro and nanosystems. With experimental methods such as the atomic force spectroscopy (AFS), it is now possible to measure these forces accurately, in addition to providing information on local material properties such as elasticity, hardness and adhesion. This review provides the theoretical and experimental background of AFS, adhesion forces, intermolecular interactions and surface forces in air, vacuum and in solution.

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