CRITICAL STEPS IN DATA ANALYSIS FOR PRECISION CASIMIR FORCE MEASUREMENTS WITH SEMICONDUCTING FILMS

Some experimental procedures and corresponding results of the precision measurement of the Casimir force between low doped Indium Tin Oxide (ITO) film and gold sphere are described. Measurements were performed using an Atomic Force Microscope in high vacuum. It is shown that the magnitude of the Casimir force decreases after prolonged UV treatment of the ITO film. Some critical data analysis steps such as the correction for the mechanical drift of the sphere-plate system and photodiodes are discussed.