4.3 Article

Effect of nano Al2O3 particles doping on electromigration and mechanical properties of Sn-58Bi solder joints

期刊

MICROELECTRONICS RELIABILITY
卷 55, 期 8, 页码 1226-1233

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2015.05.008

关键词

Nano-doping; Sn-58Bi solder; Al2O3 nanoparticle; Electromigration

资金

  1. National Natural Science Foundation of China
  2. Research Grants Council of Hong Kong: NSFC - Mainland of China/RGC - Hong Kong of China Joint Research Scheme: Electromigration and Thermomigration Studies in Nanostructured Composite Electronic Interconnects for Nanoelectronics Applications [N_CityU 101/12, 9054008]

向作者/读者索取更多资源

In the present study, the effect of Al2O3 nanoparticles on performances of Sn-58Bi solder were investigated in aspects of electro-migratio, shear strength and microhardness. The experimental results show that the Al2O3 nanoparticles significantly improved microstructure and mechanical performances of solder joints. With the addition of 0.5 wt% Al2O3, the intermetallic compounds (IMC) reduced from 2.5 mu m to 1.27 mu m after 288 aging hours at 85 degrees C. Furthermore, after electromigration test under a current density of 5 x 10(3) A/cm(2) at 85 degrees C, Bi-rich layers formed at the anode side of both Al2O3 doped and plain solder. Moreover, the addition of Al2O3 nanoparticles reduced the mean thickness of Bi-rich layer. In addition, the growth rate of the IMC layer of Al2O3 doped solder decreased by 8% compared with the plain solder. Besides, the Al2O3 doped solder exhibited better performance than plain solder in microhardness after different aging times. While, the addition of Al2O3 significantly impeded the degradation of the shear strength of solder joint after aging for 48 and 288 h. Furthermore, it was worth noting that the fracture surface of doped solder showed a typical rough and ductile structure. However, plain solder exhibited a relatively smooth and fragile surface. (C) 2015 Elsevier Ltd. All rights reserved.

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