Thickness measurement of silicon thin film coated on metal mold by analyzing infrared thermal image

An infrared thickness measuring technique for thin film coated on the metal mold was developed and applied to thickness measuring of the artificial breast implant pack. The infrared light emitted from a metal mold itself was partly absorbed to the silicon film, and the remainder of the infrared light was transmitted through the film. The relationship between the thermal image captured by an infrared camera and the film thickness was analyzed. The thicker the film, the bigger the amount absorbed. The new infrared thickness measuring technique agreed well with the results directly measured by a microscope when applied to the artificial breast implant pack. (C) 2009 Elsevier Ltd. All rights reserved,