期刊
IEEE TRANSACTIONS ON POWER ELECTRONICS
卷 28, 期 6, 页码 2711-2726出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPEL.2012.2221482
关键词
Lifetime; microinverter; photovoltaic (PV); power decoupling; reliability; single-phase inverter
资金
- U.S. Department of Energy [DE-EE0003176]
- National Natural Science Foundation of China [51177070]
The reliability of the microinverter is a very important feature that will determine the reliability of the ac-module photovoltaic (PV) system. Recently, many topologies and techniques have been proposed to improve its reliability. This paper presents a thorough study for different power decoupling techniques in single-phase microinverters for grid-tie PV applications. These power decoupling techniques are categorized into three groups in terms of the decoupling capacitor locations: 1) PV-side decoupling; 2) dc-link decoupling; and 3) ac-side decoupling. Various techniques and topologies are presented, compared, and scrutinized in scope of the size of decoupling capacitor, efficiency, and control complexity. Also, a systematic performance comparison is presented for potential power decoupling topologies and techniques.
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