期刊
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
卷 59, 期 4, 页码 1048-1053出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2012.2189246
关键词
Alpha emitter; contamination; real-time testing; secular equilibrium; single-event rate (SER); static memory; uranium; uranium disintegration chain
This work reports a long-duration (similar to 3 years) real-time underground experiment of 65 nm SRAM technology at the underground laboratory of Modane (LSM) to quantify the impact of alpha-emitter on the Soft-Error Rate (SER). We developed an original and full analytical charge deposition based on non constant Linear Energy Transfer (LET) to accurately model the diffusion/collection approach. Monte Carlo simulation results based on this improved model have been compared to experimental data to analyze the impact of alpha-particle production inside the circuit silicon material for both single and multiple chip upsets. Finally, the respective contributions of alpha emitters and atmospheric neutrons to the circuit Soft-Error Rate (SER) are evaluated and compared, considering additional real-time measurements performed in altitude on the ASTEP platform.
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