4.4 Article

Fabrication and Electrical Characterization of Densified Carbon Nanotube Micropillars for IC Interconnection

期刊

IEEE TRANSACTIONS ON NANOTECHNOLOGY
卷 8, 期 2, 页码 196-203

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNANO.2008.2011774

关键词

Carbon nanotube (CNT); densification; IC interconnection; resistance

资金

  1. Defense Advanced Research Projects Agency (DARPA)
  2. Microelectronics Advanced Research Corporation (MARCO)
  3. New York State Foundation for Science, Technology and Innovation (NYSTAR) through the Interconnect Focus Center

向作者/读者索取更多资源

Closely packed carbon nanotube (CNT) bundles are expected to have higher conductivity than copper and could potentially replace copper for electrical and thermal conductors in IC chips. However, it is extremely difficult, if not impossible, to controllably grow closely packed CNT bundles. We report on a novel postgrowth capillary densification method, which results in dramatic increase of CNT site density. Bare CNT pillars are densified approximately 15 times. High-density CNT micropillars; and micrologs with round cross sections were fabricated from CNTs coated with parylene prior to densification. These CNT micropillars and micrologs could be used as basic building blocks for future IC interconnection. Electrical characterization results show that the densification process does not mitigate the electrical conducting performance of CNTs.

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