4.6 Article

A 76-84-GHz 16-Element Phased-Array Receiver With a Chip-Level Built-In Self-Test System

期刊

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2013.2265016

关键词

Automotive radars; built-in self-test (BIST); millimeter-wave integrated circuits; phase shifters; phased arrays; silicon-germanium

资金

  1. Toyota Research Institute of North America
  2. Intel Corporation

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This paper presents a 16-element phased-array receiver for 76-84-GHz applications with built-in self-test (BIST) capabilities. The chip contains an in-phase/quadrature (I/Q) mixer suitable for automotive frequency-modulation continuous-wave radar applications, which is also used as part of the BIST system. The chip achieves 4-bit RF amplitude and phase control, an RF to IF gain of 30-35 dB at 77-84 GHz, I/Q balance of < 1 dB and < 10 degrees at 76-84 GHz, and a system noise figure of 18 dB. The on-chip BIST covers the 76-84-GHz range and determines, without any calibration, the amplitude and phase of each channel, a normalized frequency response, and can measure the gain control using RF gain control. System-level considerations are discussed together with extensive results showing the effectiveness of the on-chip BIST as compared with standard S-parameter measurements.

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