期刊
MATERIALS LETTERS
卷 150, 期 -, 页码 55-58出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2015.03.003
关键词
White light emission; Photoluminescence; Porous silicon; Silicon dioxide; Oxygen-excess defects
资金
- FONCyT [BID PICT 2010-0400, PICT 2010 BIC-0135]
- PIUNT [E/535, 26/E439]
- FONARSEC TICs [2010/02]
We report white light emission under UV excitation from porous silicon (PS) samples annealed at different temperatures and surrounding atmospheres. The photoluminescence (PL) spectra show a broad emission from ultraviolet to near infrared. Annealed PS samples were studied by photoluminescence, FTIR and EPR spectroscopies. The PL spectra were found to include three main components centered at the violet, green and infrared. The FTIR experiments suggest the formation of a system composed by silicon nanocrystals embedded in a nonstoichiometric silicon oxide matrix (nc-Si/SiOx). The EPR measurements reveal the existence of the well-know P-b0 (g similar to 2.007) and P-b1 (g similar to 2.004) centres, and of a signal at g similar to 1.9997. The combined PL, FTIR and EPR results suggest that violet and green emissions come from oxygen-excess defects in SiOx while the infrared emission is related to defects located at Si/SiOx interfaces. (C) 2015 Elsevier B.V. All rights reserved.
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