期刊
IEEE TRANSACTIONS ON MAGNETICS
卷 46, 期 5, 页码 1135-1138出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2010.2040622
关键词
Mobility; thickness; transverse domain wall; Walker breakdown; width
资金
- EPSRC [GR/T02942/01]
- Engineering and Physical Sciences Research Council [GR/T02942/01] Funding Source: researchfish
Micromagnetic modeling was used to investigate transverse domain wall propagation through Permalloy nanowires of width. w, between 10 and 120 nm and thickness, T. between 2 and 20 nm. The transverse wall mobility below Walker breakdown, mu, and Walker breakdown field, H-w depended on the exact wire dimensions, rather than simply a function of w/T, as suggested by 1-D analytical modeling. Empirical equations describing the w and T dependence of mu and H-w were found from the micromagnetic data. As the model makes no assumptions about magnetization uniformity, these equations provide a generic description of mu and H-w for transverse domain walls in Ni80Fe20 nanowires.
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