期刊
IEEE TRANSACTIONS ON MAGNETICS
卷 46, 期 1, 页码 92-94出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2009.2034473
关键词
EIS; overcoat; PMR corrosion; roughness
This paper demonstrates that electrochemical impedance spectroscopy combined with atomic force microscopy analysis can successfully characterize the coverage ability of an overcoat on perpendicular magnetic recording media. Rougher media, brought about by lower surface energy oxide segregants, can adversely impact the overcoat integrity. The role of the capping layer, and its ability to somewhat planarize the overall structure, is also discussed.
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