期刊
IEEE TRANSACTIONS ON MAGNETICS
卷 46, 期 8, 页码 3433-3436出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2010.2044143
关键词
Crack detection; eddy current testing; genetic algorithms
A method for reconstruction of zero-thickness defects, buried deep under material surface, using pulse eddy currents, is proposed. Both an integral-FEM method for simulation of transient eddy-currents and genetic algorithms, as a model-free inversion technique, are proposed. Numerical results for the inversion of the eddy-currents signals, using genetic algorithms, are shown.
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