期刊
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
卷 63, 期 11, 页码 2548-2556出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2014.2348632
关键词
Benchmark testing; decision making; fault tolerance
资金
- Spanish Project ARENES [TIN2012-38308-C02-01]
- Programa de Ayudas de Investigacion y Desarrollo through the Universitat Politecnica de Valencia, Valencia, Spain
Dependability benchmarks are aimed at comparing and selecting alternatives in application domains where faulty conditions are present. However, despite its importance and intrinsic complexity, a rigorous decision process has not been defined yet. As a result, benchmark conclusions may vary from one evaluator to another, and often, that process is vague and hard to follow, or even nonexistent. This situation affects the repeatability and reproducibility of that analysis process, making difficult the cross-comparison of results between works. To mitigate these problems, this paper proposes the integration of the analytic hierarchy process (AHP), a widely used multicriteria decision-making technique, within dependability benchmarks. In addition, an assisted pairwise comparison approach is proposed to automate those aspects of AHP that rely on judgmental comparisons, thus granting consistent, repeatable, and reproducible conclusions. Results from a dependability benchmark for wireless sensor networks are used to illustrate and validate the proposed approach.
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