4.7 Article

Design of Impedance Measuring Circuits Based on Phase-Sensitive Demodulation Technique

期刊

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2010.2084770

关键词

Analog multiplier; dual frequency; dual mode; electrical impedance tomography (EIT); phase-sensitive demodulation (PSD)

资金

  1. China Scholarship Council

向作者/读者索取更多资源

Impedance measuring circuits play a crucial role in an electrical impedance tomography system, in which capacitance and resistance need to be measured accurately at a high speed. Several impedance measuring circuits based on phase-sensitive demodulation (PSD) have been designed, tested, and presented in this paper. The measurement error is analyzed, and the mismatch of the measured capacitance and resistance is considered to be the main cause of the measurement error. A new impedance measuring circuit with dual-frequency PSD has been designed to solve this problem. It has been proven by experiment that this circuit can be used to measure both capacitance and resistance with an uncertainty of less than 0.5%.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据