期刊
MATERIALS CHARACTERIZATION
卷 104, 期 -, 页码 132-138出版社
ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2014.09.008
关键词
Cast iron; Color etching; Segregation; Electron microprobe analysis; Eutectic colony
An investigation on silicon segregation of lamellar, compacted and nodular graphite iron was carried out by applying a selective, immersion color etching and a modified electron microprobe to study the microstructure. The color etched micrographs of the investigated cast irons by revealing the austenite phase have provided data about the chronology and mechanism of microstructure formation. Moreover, electron microprobe has provided two dimensional segregation maps of silicon. A good agreement was found between the segregation profile of silicon in the color etched microstructure and the silicon maps achieved by electron microprobe analysis. However, quantitative silicon investigation was found to be more accurate than color etching results to study the size of the eutectic colonies. (C) 2014 Published by Elsevier Inc.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据