期刊
IEEE TRANSACTIONS ON FUZZY SYSTEMS
卷 16, 期 4, 页码 839-850出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TFUZZ.2008.917295
关键词
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This paper investigates the statistical properties of the Choquet and Sugeno integrals, used as multiattribute models. The investigation is done on an empirical basis, and focuses on two topics: the distribution of the output of these integrals when the input is corrupted with noise, and the robustness of these models when they are identified using some set of learning data through some learning procedure.
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