4.6 Article

Atomistic Investigation of Low-Field Mobility in Graphene Nanoribbons

期刊

IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 58, 期 9, 页码 2824-2830

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2010.2100045

关键词

Defects; edge roughness; graphene nanoribbons; impurities; low-field mobility; phonons; scattering

资金

  1. European Commission through the Network of Excellence Silicon-based nanostructures and nanodevices [216171]
  2. Graphene-based Nanoelectronic Devices project [215752]
  3. Ministero dell'Istruzione, dell'Universita e della Ricerca [2008S2CLJ9]
  4. Consiglio Nazionale delle Ricerche
  5. European Commission [ERAS- CT-2003-980409]

向作者/读者索取更多资源

We have investigated the main scattering mechanisms affecting the mobility in graphene nanoribbons using detailed atomistic simulations. We have considered carrier scattering due to acoustic and optical phonons, edge roughness, single defects, and ionized impurities, and we have defined a methodology based on simulations of statistically meaningful ensembles of nanoribbon segments. Edge disorder heavily affects the mobility at room temperature in narrower nanoribbons, whereas charged impurities and phonons are hardly the limiting factors. Results are favorably compared with the few experiments available in the literature.

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